Junlin Hu

Associate Professor
School of Software
Beihang University, Beijing, China
Email: hujunlin@buaa.edu.cn

胡峻林,副教授,博士生导师,北京航空航天大学软件学院
工作经历:北京航空航天大学 (副教授)、北京化工大学 (副教授)、南洋理工大学 (博士后)
教育情况:南洋理工大学 (博士)、北京师范大学 (硕士)、西安理工大学 (学士)
研究领域:计算机视觉、模式识别、机器学习
研究内容:人脸识别、行人再识别、图像分类、视觉跟踪、度量学习、深度学习、特征学习
电子邮件:hujunlin@buaa.edu.cn

About Me

I am an Associate Professor at School of Software, Beihang University, China. Before that I was an Associate Professor at College of Information Science and Technology, Beijing University of Chemical Technology, China. I worked as a Research Fellow with Prof. Yap-Peng Tan at School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore. I received my PhD from Nanyang Technological University, supervised by Prof. Yap-Peng Tan and co-supervised by Prof. Jiwen Lu. I received my M.Eng in Pattern Recognition from Beijing Normal University, and B.Eng in Electronic and Information Engineering from Xi'an University of Technology, respectively.

Research

My research interests include computer vision, pattern recognition, and biometrics.

Publications

Google scholar citations    Scopus

Jiawei Chen, Junlin Hu. Weakly-Supervised Compositional Metric Learning for Face Verification. IEEE Transactions on Instrumentation and Measurement (T-IM), 2021. [pdf]

Jiawei Chen, Zhengwei Guo, Junlin Hu. Ring-Regularized Cosine Similarity Learning for Fine-Grained Face Verification. Pattern Recognition Letters, 2021. [pdf]

Junlin Hu, Jiwen Lu, Yap-Peng Tan. Sharable and Individual Multi-view Metric Learning. IEEE Transactions on Pattern Analysis and Machine Intelligence (T-PAMI), 2018. [pdf]

Junlin Hu, Jiwen Lu, Yap-Peng Tan, Junsong Yuan, Jie Zhou. Local Large-Margin Multi-Metric Learning for Face and Kinship Verification. IEEE Transactions on Circuits and Systems for Video Technology (T-CSVT), 2018. [pdf]

Junlin Hu, Yap-Peng Tan. Nonlinear Dictionary Learning with Application to Image Classification. Pattern Recognition, 2018. [pdf]

Jiwen Lu, Junlin Hu, Jie Zhou. Deep Metric Learning for Visual Understanding: An Overview of Recent Advances. IEEE Signal Processing Magazine (SPM), 2017. [pdf]

Jiwen Lu, Junlin Hu, Yap-Peng Tan. Discriminative Deep Metric Learning for Face and Kinship Verification. IEEE Transactions on Image Processing (T-IP), 2017. [pdf]

Junlin Hu, Jiwen Lu, Yap-Peng Tan, Jie Zhou. Deep Transfer Metric Learning. IEEE Transactions on Image Processing (T-IP), 2016. [pdf]

Junlin Hu, Jiwen Lu, Yap-Peng Tan. Deep Metric Learning for Visual Tracking. IEEE Transactions on Circuits and Systems for Video Technology (T-CSVT), 2016. [pdf]

Junlin Hu, Jiwen Lu, Yap-Peng Tan. Deep Transfer Metric Learning. IEEE Conference on Computer Vision and Pattern Recognition (CVPR), 2015. [pdf]

Junlin Hu, Jiwen Lu, Yap-Peng Tan. Fine-Grained Face Verification: Dataset and Baseline Results. International Conference on Biometrics (ICB), 2015. [pdf]

Junlin Hu, Jiwen Lu, Yap-Peng Tan. Discriminative Deep Metric Learning for Face Verification in the Wild. IEEE Conference on Computer Vision and Pattern Recognition (CVPR), 2014. [pdf]

Junlin Hu, Jiwen Lu, Junsong Yuan, Yap-Peng Tan. Large Margin Multi-Metric Learning for Face and Kinship Verification in the Wild. Asian Conference on Computer Vision (ACCV), 2014. [pdf]

Junlin Hu, Yongxin Ge, Jiwen Lu, Xin Feng. Makeup-Robust Face Verification. IEEE International Conference on Acoustics, Speech, and Signal Processing (ICASSP), 2013. [pdf] [data]

Jiwen Lu, Junlin Hu, Xiuzhuang Zhou, Yuanyuan Shang, Yap-Peng Tan, Gang Wang. Neighborhood Repulsed Metric Learning for Kinship Verification. IEEE Conference on Computer Vision and Pattern Recognition (CVPR), 2012. [pdf]

Download

The Kinship Face in the Wild (KinFaceW) database and results are available here: KinFaceW.
The Fine-Grained Face Verification (FGFV) dataset is provided upon request.
The Face Makeup (FAM) database is available here: FAM.

Services

Reviewer, IEEE TPAMI/TIP/TNNLS/TCSVT/TMM/TIFS...
Reviewer, CVPR/ICCV/ECCV/WACV/AAAI/IJCAI/MM/ICME/ICIP...
Area Chair, IEEE International Conference on Multimedia and Expo (ICME), 2020, 2021

Others